Length Measurement in Longitudinal Images
Recognize target fibers in microscopic scans and extract length measurements, preserving the link between images and results.
Fiber Analysis · High-throughput / Desktop
Silicon Carbide Fiber Length Analysis System
Automated scanning and individual length measurement for SiC fibers in longitudinal images, with distribution reports, human review and data export.
- Length range: 20–6000 μm
- Individual fiber images linked to measurements and distribution statistics
- Automatically generated reports, followed by human review
From Individual Measurements to Length Distributions
Statistical Reports
Report fiber count, D10, D90, standard deviation, maximum, minimum, coefficient of variation, geometric and arithmetic means, and length distribution histograms.
Reviewable Results
The system organizes measurements and generates reports automatically. Operators review individual fiber images before confirming the report and data for delivery.
Report and Data Export
Organize statistical tables and distribution charts for your inspection needs, with result traceability and report and data export.
Specifications and Equipment Options
Choose high-throughput equipment for batch inspection and continuous loading, or desktop equipment for single-slide inspection and routine analysis. Both platforms can be configured for automated scanning, recognition, measurement, report generation and human review.
| Product model | TW-H-20X-N-SC-LD-01 |
|---|---|
| Equipment platform | High-throughput |
| Length range | 20～6000 μm |
| Nominal length measurement precision (brochure) | 0.1 μm |
| Fibers measured per run | ≤10,000 fibers |
| Optical magnification | 200× |
| Digital magnification | 1000× |
| Report storage capacity | 100,000 reports |
| Digital slide storage capacity | 20,000 slides |
| Power supply | AC220V ±15%，50/60Hz |
| Power consumption | ≤300VA |
| Operating temperature | 5℃～40℃ |
| Relative humidity | ≤80% |
| Sample loading capacity | 30–240 slides per load; supports continuous loading and unloading |
| Scanning speed | ≤10.6 cm²/min |
| Scanning resolution | ≤0.35 μm/pixel |
| Nominal inspection time (brochure) | 3 min |
| Continuous operation | 24/7 unattended operation |
| Operating system | Linux、Windows |
| Product model | TW-D-20X-N-SC-LD-01 |
|---|---|
| Equipment platform | Desktop |
| Length range | 20～6000 μm |
| Nominal length measurement precision (brochure) | 0.1 μm |
| Fibers measured per run | ≤10,000 fibers |
| Optical magnification | 200× |
| Digital magnification | 1000× |
| Report storage capacity | 2,000 reports |
| Digital slide storage capacity | 100 slides |
| Power supply | AC220V ±15%，50/60Hz |
| Operating temperature | 5℃～40℃ |
| Relative humidity | ≤80% |
| Sample loading capacity | Single slide |
| Scanning speed | ≤10.6 cm²/min |
| Scanning resolution | ≤0.35 μm/pixel |
| Nominal inspection time (brochure) | Depends on scan area and preparation; evaluated using actual samples |
| Operating system | Windows |
High-throughput specifications are taken from the SiC product brochure. Sample compatibility and actual inspection time are confirmed through configuration selection and sample evaluation.
Automatic Reports, Followed by Human Review
01 Preparation and Scanning
After preparation and loading, the system automatically focuses and captures high-resolution microscopic images.
02 Recognition and Measurement
Recognize fibers, extract length measurements and compile valid results.
03 Automatic Report Generation
Compile statistics and distribution histograms to generate an inspection report automatically.
04 Human Review and Export
Review measurements against the original images, then export confirmed reports and data.
The Same System Also Supports Diameter Measurement
The high-throughput platform in the product brochure supports SiC fiber diameter and length measurement in longitudinal images. Analysis functions can be configured for your inspection tasks.
Explore Diameter MeasurementValidate the Solution with Your Samples
Tell us your sample type, target measurements, inspection volume and report requirements. Send samples to evaluate imaging, recognition and measurement performance.
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